[𝗡𝗮𝗻𝗼𝘀𝗰𝗮𝗹𝗲 𝗘𝗹𝗲𝗰𝘁𝗿𝗼𝗰𝗵𝗲𝗺𝗶𝘀𝘁𝗿𝘆: 𝗦𝗘𝗖𝗠 𝗪𝗲𝗲𝗸 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟭] Is seeing what happens at electrode interfaces important for your electrochemical research? If so, electrochemical atomic force microscopy (EC-AFM) could be just what you need! This video introduces the key concepts of 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗰𝗵𝗲𝗺𝗶𝗰𝗮𝗹 𝗮𝘁𝗼𝗺𝗶𝗰 𝗳𝗼𝗿𝗰𝗲 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗘𝗖-𝗔𝗙𝗠). In this technique, the sample serves as the working electrode in an electrochemical cell, while an AFM probe measures changes in its surface morphology in-situ. 💡𝗙𝗶𝗻𝗱 𝗼𝘂𝘁 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗘𝗖-𝗔𝗙𝗠 𝗵𝗲𝗿𝗲: okt.to/SALwE6  #AFM #Electrochemistry #ECAFM #howAFMworks

Final Call | ISE Webinar 🔬 Explore how ISE enables high-resolution, non-destructive mapping of film thickness and optical properties in oxide thin films. 📅 October 27, 2026 🔗 Register now: okt.to/fnNKpC #ISE #ThinFilms #Metrology

Great conversations, curious questions, and plenty of interest around the instruments at 𝗡𝗔𝗡𝗢𝘀𝗰𝗶𝗲𝗻𝘁𝗶𝗳𝗶𝗰 𝗦𝘆𝗺𝗽𝗼𝘀𝗶𝘂𝗺 𝗦𝗘 𝗔𝘀𝗶𝗮 𝟮𝟬𝟮𝟲 in Kuala Lumpur last week. Park Systems provided a 𝗣𝗮𝗿𝗸 𝗙𝗫𝟰𝟬 𝗔𝗙𝗠 for live demonstrations, giving participants the chance to see advanced AFM workflows up close and discuss applications directly with our team. We were also pleased to sponsor the 𝗽𝗼𝘀𝘁𝗲𝗿 𝗮𝘄𝗮𝗿𝗱𝘀 and support researchers contributing to the region’s growing work in nanoscience, semiconductors, energy, and advanced materials. #ParkSystems #NANOscientificSymposium #NSSSEA2026 #AFM #SPM #Nanotechnology #Nanoscience #Semiconductors #AdvancedMaterials

In this 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗰𝗵𝗲𝗺𝗶𝘀𝘁𝗿𝘆 #webinar, you will learn what can nanoscale probe microscopy reveal at 𝗮𝗰𝘁𝗶𝘃𝗲 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗱𝗲 𝗶𝗻𝘁𝗲𝗿𝗳𝗮𝗰𝗲𝘀? Our guest speaker, Prof. Dr. Christine Kranz, Ulm University, will present studies of solid-electrolyte interphase formation on hard-carbon electrodes and real-time swelling of redox-polymer electrodes, showing how ion insertion induces structural and nanomechanical changes. 👉𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿: okt.to/AsDzLX #BatteryResearch #Electrochemistry #AFM #SECCM #EnergyStorage

What happens when the angle between layers becomes a control parameter for electronic behaviour? In a new 𝗡𝗮𝘁𝘂𝗿𝗲 𝗠𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 study, researchers show that anomalous gating in bilayer graphene/hBN heterostructures is governed by the relative alignment of the two hBN layers. To study this effect, the team precisely adjusted the device angle using AFM-guided mechanical manipulation and tracked how the electronic response changed. Park FX40 supported this workflow through contact-mode manipulation, with room-temperature transport measurements performed inside the AFM. 📜 Link to the paper: okt.to/WUkuV8 💡Explore our 𝗰𝗮𝘀𝗲 𝘀𝘁𝘂𝗱𝘆 with the paper’s corresponding author, 𝗥𝗲𝗯𝗲𝗰𝗮 𝗥𝗶𝗯𝗲𝗶𝗿𝗼-𝗣𝗮𝗹𝗮𝘂 𝘁𝗼 𝗹𝗲𝗮𝗿𝗻 𝗵𝗼𝘄 𝗙𝗫𝟰𝟬 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗼𝗻 𝗵𝗲𝗹𝗽𝘀 𝘀𝗶𝗺𝗽𝗹𝗶𝗳𝘆 𝗰𝗼𝗺𝗽𝗹𝗲𝘅, 𝗺𝘂𝗹𝘁𝗶-𝘂𝘀𝗲𝗿 𝗔𝗙𝗠 𝘄𝗼𝗿𝗸𝗳𝗹𝗼𝘄𝘀 in advanced 2D materials research: okt.to/YXvtPT

Resolving 2D materials means capturing more than one length scale at once. In the image below, 𝗣𝗮𝗿𝗸 𝗡𝗫𝟭 reveals twisted bilayer graphene on SiC with both the atomic honeycomb lattice and the longer-period moiré superlattice visible in the same dataset. The moiré pattern shows a periodicity of ~1.5 nm, superimposed on the graphene lattice with its characteristic 2.46 Å interatomic spacing. The FFT confirms both signals simultaneously: inner spots from the moiré periodicity and outer hexagonal spots from the atomic lattice. For researchers studying twist angle, stacking order, and van der Waals heterostructures, 𝗡𝗫𝟭 𝗯𝗿𝗶𝗻𝗴𝘀 𝗮𝘁𝗼𝗺𝗶𝗰 𝗮𝗻𝗱 𝗺𝗼𝗶𝗿é 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝗶𝗻𝘁𝗼 𝗮 𝘀𝘁𝗮𝗯𝗹𝗲, 𝗽𝗿𝗮𝗰𝘁𝗶𝗰𝗮𝗹 𝗔𝗙𝗠 𝘄𝗼𝗿𝗸𝗳𝗹𝗼𝘄. 💡𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝗣𝗮𝗿𝗸 𝗡𝗫𝟭: okt.to/pPaCJG Image caption: LFM imaging of twisted bilayer graphene on SiC with Park NX1: (a,b,e) atomic lattice + moiré pattern, (c) FFT, (d) graphene lattice. #AFM #Graphene #2DMaterials #Moiré #Nanotechnology #ParkSystems

How does automation expand what is possible in advanced 2D materials research? In our new 𝗰𝘂𝘀𝘁𝗼𝗺𝗲𝗿 𝗰𝗮𝘀𝗲 𝘀𝘁𝘂𝗱𝘆, 𝗥𝗲𝗯𝗲𝗰𝗮 𝗥𝗶𝗯𝗲𝗶𝗿𝗼-𝗣𝗮𝗹𝗮𝘂 of Université Paris-Saclay shares how 𝗣𝗮𝗿𝗸 𝗙𝗫𝟰𝟬 𝘀𝗶𝗺𝗽𝗹𝗶𝗳𝗶𝗲𝘀 𝗱𝗲𝗺𝗮𝗻𝗱𝗶𝗻𝗴 𝗔𝗙𝗠 𝘄𝗼𝗿𝗸𝗳𝗹𝗼𝘄𝘀 in a busy multi-user lab. Automated probe exchange, reliable mode switching, and precise return to the same region help make complex measurements more reproducible across users. The case study also highlights how FX40 enables precise mechanical manipulation of sophisticated 2D devices, as demonstrated in controlled angular studies of dynamically rotatable bilayer graphene/hBN heterostructures, recently published in 𝗡𝗮𝘁𝘂𝗿𝗲 𝗠𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 (DOI: 10.1038/s41563-026-02667-7). 👉 𝗥𝗲𝗮𝗱 𝘁𝗵𝗲 𝗰𝗮𝘀𝗲 𝘀𝘁𝘂𝗱𝘆 𝗮𝗻𝗱 𝗲𝘅𝗽𝗹𝗼𝗿𝗲 𝗣𝗮𝗿𝗸 𝗙𝗫𝟰𝟬: okt.to/TvzINj #ParkSystems #FX40 #AFM #2DMaterials #Graphene #hBN #Nanotechnology Image caption: Park FX40 AFM error-signal images show a dynamically rotatable bilayer graphene/hBN heterostructure at two angular configurations. The hBN rotator was mechanically manipulated with the AFM tip in contact mode to control the relative layer alignment. Images courtesy of Université Paris-Saclay and CNRS.

𝗛𝗼𝘄 𝗰𝗮𝗻 𝘆𝗼𝘂 𝘀𝘁𝘂𝗱𝘆 𝗯𝗮𝘁𝘁𝗲𝗿𝘆 𝗶𝗻𝘁𝗲𝗿𝗳𝗮𝗰𝗲𝘀 𝘄𝗵𝗶𝗹𝗲 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗰𝗵𝗲𝗺𝗶𝗰𝗮𝗹 𝗽𝗿𝗼𝗰𝗲𝘀𝘀𝗲𝘀 𝗮𝗿𝗲 𝗮𝗰𝘁𝘂𝗮𝗹𝗹𝘆 𝗵𝗮𝗽𝗽𝗲𝗻𝗶𝗻𝗴? Discover how SECCM, conductive AFM, electrochemical AFM and PinPoint™ nanomechanical mapping provide complementary information on battery electrodes. The webinar will show how these methods probe solid-electrolyte interphase formation, local nanomechanical properties and real-time volume changes at the nanoscale during operation. 🎤𝗦𝗽𝗲𝗮𝗸𝗲𝗿: Prof. Prof. Dr. @Christine Kranz, Ulm University, Germany 👉𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿: okt.to/KhNjUf #SECCM #AFM #Electrochemistry #BatteryMaterials #Nanotechnology

At SEMICON West? Meet Park Systems at Booth #245! Explore in-line AFM metrology for precise wafer measurements and 3D surface characterization, supporting evolving needs in AI and advanced packaging. 📍 Moscone Center, San Francisco | Oct 13–15 #SEMICONWest #ParkSystems

Conductive AFM on 2D materials faces a demanding challenge: resolving local electrical contrast while preserving atomic-scale structural information in the same scan. This image of Bernal-stacked bilayer graphene on silicon carbide, acquired on the 𝗣𝗮𝗿𝗸 𝗡𝗫𝟭, shows how much detail conductive AFM can reveal. 𝗧𝘄𝗼 𝗳𝗲𝗮𝘁𝘂𝗿𝗲𝘀 𝘀𝘁𝗮𝗻𝗱 𝗼𝘂𝘁: 🔹 Atomic lattice: the top graphene layer shows its hexagonal lattice, with a pitch of about 2.5 Å. 🔹 Moiré pattern: a superstructure with ~1.8 nm periodicity, arising from the lattice mismatch between the carbon buffer layer and the SiC substrate. The measurement was performed on Park NX1 with a Femto DLPCA-200 current amplifier and using a PPP-EFM probe from @NANOSENSORS. 💡𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗡𝗫𝟭: okt.to/XbIYmc Sample courtesy of Prof. @Martin Rejhon, Institute of Physics, Charles University, Prague. Thank you for kindly providing the sample! #AFM #Graphene #2DMaterials #Nanotechnology #ConductiveAFM #ParkSystems #MaterialsScience

Women shape the future of science. This 𝗔𝗱𝗮 𝗟𝗼𝘃𝗲𝗹𝗮𝗰𝗲 𝗗𝗮𝘆, Park Systems celebrates women advancing semiconductors, materials and energy research, and affirms equal rights, recognition and opportunities across STEM. Who inspires your work? #AdaLovelaceDay #WomenInSTEM

Final Call | PFM Webinar 🔬 Explore PFM fundamentals and advanced techniques including Contact-Resonance PFM and DFRT-PFM for nanoscale characterization of piezoelectric and ferroelectric materials. 📅 October 13, 2026 🔗 Register now: okt.to/39BugV #AFM #PFM #MaterialsScience

[Press Release] Park Systems 𝗹𝗲𝗮𝗱𝘀 𝘁𝗵𝗲 𝗴𝗹𝗼𝗯𝗮𝗹 𝗔𝗙𝗠 𝗺𝗮𝗿𝗸𝗲𝘁 by revenue for the fourth consecutive year (2022–2025), according to QY Research AFM Market Report. With 23.8% of global AFM revenue and 340 systems sold in 2025, the company ranked first in revenue and unit shipments. Building on this leadership, Park Systems has expanded its research-grade AFM portfolio with 𝗡𝗫𝟭 𝗳𝗼𝗿 𝗮𝘁𝗼𝗺𝗶𝗰-𝘀𝗰𝗮𝗹𝗲 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 under ambient conditions, while broadening its capabilities through 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝘀𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗲𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 (𝗜𝗦𝗘) and 𝗱𝗶𝗴𝗶𝘁𝗮𝗹 𝗵𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗗𝗛𝗠). These developments come as the global AFM market is forecast to grow from $508.69 million in 2025 to $1.01 billion by 2032, at a compound annual growth rate of 11.23%. 💡𝗥𝗲𝗮𝗱 𝘁𝗵𝗲 𝗳𝘂𝗹𝗹 𝗽𝗿𝗲𝘀𝘀 𝗿𝗲𝗹𝗲𝗮𝘀𝗲: okt.to/9Zpweg #ParkSystems #AFM #Nanometrology #AFMleader

They did it again! 💪🏃 Another year, another 𝗚ö𝘁𝘁𝗶𝗻𝗴𝗲𝗻 𝗢𝗯𝘀𝘁𝗮𝗰𝗹𝗲 𝗖𝗶𝘁𝘆 𝗥𝘂𝗻 for the 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗔𝗰𝗰𝘂𝗿𝗶𝗼𝗻 𝘁𝗲𝗮𝗺. This time, 18 colleagues faced 6 km and 21 obstacles, pushing through nearly three hours of running, climbing, crawling, water, mud and plenty of teamwork. A tough challenge, a strong team and one more finish line crossed together. Congratulations to everyone who took part and brought the Park Systems team spirit to the course! 🎉 Already wondering what challenge comes next... 😎 #ParkSystems #TeamSpirit #ObstacleCityRun #Göttingen

One technique rarely answers every question in a complex sample. 𝗔𝘁𝗼𝗺𝗶𝗰 𝗙𝗼𝗿𝗰𝗲 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆, 𝗡𝗮𝗻𝗼-𝗜𝗥 𝘀𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝘆, 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 and 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 reveal complementary information: from structure and chemistry to thin-film properties and dynamics. 🔔Follow Park Systems for multimodal measurement ideas you can apply in the lab.

The @CAS International Semiconductor Conference, IEEE event brings together researchers and engineers working across semiconductor devices, micro- and nanosystems, MEMS, sensors and advanced materials. We are also pleased to contribute to the scientific program with a plenary presentation by 𝗗𝗿. 𝗝𝗮𝗺𝗲𝘀 𝗞𝗲𝗿𝗳𝗼𝗼𝘁, Park Systems UK Ltd.: "𝗔𝘁𝗼𝗺𝗶𝗰 𝗙𝗼𝗿𝗰𝗲 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 𝗳𝗼𝗿 𝗡𝗮𝗻𝗼𝘀𝗰𝗮𝗹𝗲 𝗠𝗼𝗿𝗽𝗵𝗼𝗹𝗼𝗴𝗶𝗰𝗮𝗹 𝗮𝗻𝗱 𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗰𝗮𝗹 𝗖𝗵𝗮𝗿𝗮𝗰𝘁𝗲𝗿𝗶𝘀𝗮𝘁𝗶𝗼𝗻 𝗼𝗳 𝗦𝗲𝗺𝗶𝗰𝗼𝗻𝗱𝘂𝗰𝘁𝗼𝗿𝘀" Thursday, October 15 | 10:00 | Room 1 The talk will explore emerging AFM applications including ferroelectric and memristive devices, dopant and carrier mapping, buried-interface characterization, and nanoscale chemical analysis using nano-IR spectroscopy. If you are attending CAS 2026, visit us and @Schaefer SEE Srl to discuss your semiconductor, MEMS and nanoscale characterization challenges. 💡𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗦𝗼𝗹𝘂𝘁𝗶𝗼𝗻𝘀: okt.to/wTBxY6 #semiconductors #AFM #MEMS #nanotechnology #Metrology #DigitalHolographicMicroscopy #ParkSystems

Explore oxide thin films with ISE 🔬 Learn how Imaging Spectroscopic Ellipsometry enables high-resolution mapping of film thickness and optical properties while revealing local variations across oxide thin films. 📅 October 27, 2026 🔗 Register: okt.to/bzUWjJ #ISE #ThinFilms #Metrology

What does fully automated AFM metrology look like? From wafer loading to analysis, 𝗣𝗮𝗿𝗸 𝗡𝗫-𝗪𝗮𝗳𝗲𝗿 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗲𝘀 𝗲𝗮𝗰𝗵 𝗸𝗲𝘆 𝘀𝘁𝗲𝗽: receiving the host recipe, selecting the probe, aligning the wafer, moving to target sites, measuring and reporting. Reduce manual intervention and bring repeatable nanoscale metrology into semiconductor production. 💡𝗦𝗲𝗲 𝘁𝗵𝗲 𝘄𝗼𝗿𝗸𝗳𝗹𝗼𝘄. 𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲: okt.to/QXbUgp

We were excited to meet so many researchers in Boston and see our tools in action at 𝗡𝗔𝗡𝗢𝘀𝗰𝗶𝗲𝗻𝘁𝗶𝗳𝗶𝗰 𝗦𝘆𝗺𝗽𝗼𝘀𝗶𝘂𝗺 𝗔𝗺𝗲𝗿𝗶𝗰𝗮𝘀 𝟮𝟬𝟮𝟲 this week. Park Systems supported live demonstrations and hands-on sessions with advanced 𝗔𝗙𝗠, 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆, 𝗮𝗻𝗱 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆. It was great to see participants testing workflows, asking detailed questions, and discussing real applications directly with our team. We were also pleased to sponsor the 𝗕𝗲𝘀𝘁 𝗣𝗼𝘀𝘁𝗲𝗿 𝗔𝘄𝗮𝗿d and recognize outstanding research presented during the symposium. #ParkSystems #NANOscientific Symposium #NSSAmericas #AFM #DHM #ISE #SPM #Nanoscience”

Explore PFM at the nanoscale 🔬 Learn the fundamentals of Piezoresponse Force Microscopy and explore advanced techniques including Contact-Resonance PFM and DFRT-PFM for piezoelectric and ferroelectric materials. 📅 October 13, 2026 🔗 Register: okt.to/No9tb3 #AFM #PFM #MaterialsScience